The PB3600 provides the latest techniques in testing and maintaining probe cards. Designed through joint development with many of the world’s largest semiconductor and probe card manufacturers, ITC has produced an ergonomic analyzer with the greatest measurement resolution, highest throughput, most flexibility and still made it easy to use.
The system includes: Automated probe card flip fixture, RID MUX system with 1536 measurement channels, Any channel can be software assigned to be relay drive, Measurement chuck with sapphire camera window, and more
- Best Price/Performance of any probe card analyzer
- High throughput production machine
- Easy to operate
- Simplified card files
- Overlapped testing for faster analysis of cards
- Vacuum held cleaning plates, overdriven leakage and contact resistance test plates
- Test or relay drive on any channel through software control
- Expandable to 3072 channels
- 100Kg (220 lb) Lift force
- Leakage
- OD Leakage
- Capacitor Leakage
- Alignment
- Scrub Analysis
- Tip Diameter
- Planarity
- Contact Resistance
- Wire Check
- Capacitance
- Relays
- Gram Force
- Resistance
- Elevated Heat Levels with our Hot Chuck option
The Probilt PB6500 has many features that make it the ideal analyzer for all probe card technologies, including the latest probe tip geometries being used to test leading edge semiconductor devices. Its excellent electrical measurement capability and the ability to drive relays on any channel make it the best tool for probe cards with complex circuits and relays on the PCB. With 300Kg of lift force, it has long been recognized as the analyzer of choice for vertical probe card manufacturers.
The ITC line of Probilt, probe card analyzers provide fast, accurate and repeatable test data for all types of probe card technologies. Simple user definable vision parameters allow even the newest and most complex probe tip geometries to be captured and accurately measured.
- PB6500 offers 11 x9.5” chuck for 200 mm arrays
- High volume production throughput
- Fast Quad Core Processor
- Distributed Processing
- Overlapped Tests
- Motherboard/MUX Interface – No Cables
- 12,000 Channel Capability
- Kinematic coupling for high repeatability
- Fast motherboard and probe card change
- Software configurable relay control
- Enhanced high performance LED lighting
- Portable lighting recipes for all technologies
- Tests all probe card technologies
- Closed loop stage with 0.1μ encoders
- 12” x 8” stage travel for largest cards
- 300Kg force Z stage, 0.75” travel
- Powerful, easy to use software
- Simple test program generation
The ITC line of Probilt, probe card analyzers provide fast, accurate and repeatable test data for all types of probe card technologies. Simple user definable vision parameters allow even the newest and most complex probe tip geometries to be captured and accurately measured. Probilt’s PB6800 large measurement chuck allows probe arrays as big as 300 mm in diameter to be touched down without overhanging the chuck surface.
The Probilt has many features that make it the ideal analyzer for all probe card technologies, including the newest probe cards being used to test the largest memory arrays. Its excellent electrical measurement capability and the ability to drive relays on any channel make it the best tool for probe cards with complex circuits and relays on the PCB. With 300Kg of lift force, it has long been recognized as the analyzer of choice for vertical probe card manufacturers.
- PB6800 offers 12” dia. chuck for 300 mm arrays
- High volume production throughput
- Fast Quad Core Processor
- Distributed Processing
- Overlapped Tests
- Motherboard/MUX Interface – No Cables
- 12,000 Channel Capability
- Kinematic coupling for high repeatability
- Fast motherboard and probe card change
- Software configurable relay control
- Enhanced high performance LED lighting
- Portable lighting recipes for all technologies
- Tests all probe card technologies
- Closed loop stage with 0.1μ encoders
- 12” x 8” stage travel for largest cards
- 300Kg force Z stage, 0.75” travel
- Powerful, easy to use software
- Simple test program generation
The PB1500 is a low cost probe card analyzer system. It has the capability to perform all the tests done on the larger PB3600/6500 probe card analyzers, but at a lower cost for low pincount cards. A maximum of 1,280 channels may be configured in the PB1500 MUX system. The Precision Measurement Unit (PMU) has the same accuracy, repeatability and range as the larger analyzers. The repair process consists of selecting a failing probe, which moves it under the binocular microscope and positions a crosshair over the correct position for that probe. Thus the probe is not only easily identified, the operator has a true reference (the crosshair) for the correct alignment position. The repair process time is cut to 1/2 or 1/3 that of standard analyzers or alignment stations.
The PB1500 is a bench-top instrument and comes complete with all required hardware. ITC provides low cost, standard motherboards for most probe card types. A sturdy bench provides the optimum in convenience and ergonomics.
- Fast, simple probe card repair
- Crosshair shows proper probe position
- Tips up configuration for easy repair
- Excellent ergonomics
- Fast retest without flip
- Leica MZ80 binocular microscope
- Accurate, repeatable stage
- Closed loop with 0.1µ encoders
- 6” x 6” stage movement
- Up to 3” x 3” arrays
- 100 lb Force Z stage, 2.0” stroke
- Simple, economical motherboards
- Up to 1,280 channels
- Fast change motherboards/probe cards
- Up to 15” diameter probe cards
- Powerful Probilt™ software
- Same software as PB3600/6500
- Network with PB3600/6500
- Works with all probe card technologies
- Test and repair any technology
- Excellent for tight pitch shelf cards
- Alignment
- Planarity
- Contact Resistance
- Leakage
- Wire Check
- Capacitor values and leakage
- Resistor values
- Gram Force (optional)
The PB1200 is an automated probe card repair system. It has the capability to fully test alignment, planarity and (optionally) gram force, but its main purpose is in card repair. Test data may also be imported from a PB3600, PB6500 or other manufacturers probe card analyzers. The repair process consists of selecting a failing probe, which moves it under the binocular microscope and positions a crosshair over the correct position for that probe. Thus the probe is not only easily identified, the operator has a true reference (the crosshair) for the correct alignment position. The repair process time is cut to 1/2 or 1/3 that of standard analyzers or alignment stations.
The PB1200 is a bench-top instrument and comes complete with all required hardware. Expensive motherboards are not required and are replaced by simple, economical card holders. ITC has card holders available for most standard probe cards and can provide custom solutions. A sturdy bench provides the optimum in convenience and ergonomics.
- Fast, simple probe card repair
- Crosshair shows proper probe position
- Tips up configuration for easy repair
- Excellent ergonomics
- Fast retest without flip
- Leica MZ80 binocular microscope
- Accurate, repeatable stage
- Closed loop with 0.1µ encoders
- 6” x 6” stage movement
- Up to 3” x 3” arrays
- 100 lb Force Z stage, 2.0” stroke
- Simple, economical card holders
- No motherboards
- Fast change motherboards/probe cards
- Up to 15” diameter probe cards
- Powerful Probilt™ software
- Same software as PB3600/6500
- Network with PB3600/6500
- Works with all probe card technologies
- Test and repair any technology
- Excellent for tight pitch shelf cards
- Alignment
- Planarity
- Gram Force (optional)